XRD のQMの意味
XRD のQMの意味備忘録QMTermDefinitionS or ★Starhigh-quality diffractometer or Guinier data, chemical composition has been well-characterized, intensities have been measured objectively, good range and even spread of intensity, etc.RRietveldd-values are directly the result of Rietveld refinement of the data (only accepted in unusual cases)GGoodmaterial has significant amorphous content and has a digital diffraction pattern with good signal-to-noise ratioIIndexedpattern has been indexed; therefore, the material is almost certainly single-phaseCCalculatedcalculated from single-crystal structural parameters; structural refinement R-factor was <0.10PPrototypingused in the LPF. Prototype structure is an editorial action?(i.e., assigned by the PDF editor, not the original source) to assign space group coordinates for entries that have not determined this from the primary literatureMMinimal Acceptablesimilar to good except no chemical analysis data was submitted to support the materials composition?BBlankdoes not meet Star, Indexed, or Low-Precision criteriaOLow-Precisiondata taken on poorly characterized material or data known (or suspected) to be low precisionHHypotheticalcalculated from the atomic positions and thermal parameters of an isostructural compoundリリーコンシェルジュ株式会社のボランティア修理担当が社長のブログをお借りして、発言させていただきました。